Syllabus Application
MAT 571
Introduction to Electron Microscopy
Faculty
Faculty of Engineering and Natural Sciences
Semester
Fall 2026-2027
Course
MAT 571 -
Introduction to Electron Microscopy
Time/Place
Time
Week Day
Place
Date
14:40-16:30
Mon
FENS-L055
Sep 28-Dec 31, 2026
13:40-14:30
Thu
FENS-L029
Sep 28-Dec 31, 2026
Level of course
Masters
Course Credits
SU Credit:3, ECTS:10
Prerequisites
-
Corequisites
MAT 571L
Course Type
Lecture
Instructor(s) Information
Mehmet Ali Gülgün
- Email: m-gulgun@sabanciuniv.edu
Course Information
Catalog Course Description
The course will treat electron optics and diffraction physic as a basis for the advanced course. It will go into the construction and functions of different types of electron microscopes and detectors. The largest portion of the course is devoted to analyzing materials and their defects with the help of electron optics and diffraction physics. A short but essential introduction to analytical electron microscopy and spectroscopic techniques will be given. The course will have 3-4 laboratory exercises to introduce practical issues with the electron microscopy.
Learning Outcomes:
| 1. | AIMS ? To teach the student fundamentals of using electrons in imaging of materials and demonstrate the main differences between Electron Microscopy and Optical Microscopy ? To define the limits of scanning electron microscopy (SEM) and introduce the concepts in transmission electron microscopy (TEM). ? To explain the capabilities and science behind the TEM technique. INTENDED LEARNING OUTCOMES 1. Module Specific Skills. By the end of this module, the students should be able to: (a) Know the working principle of SEM and how images are obtained (b) Explain the types of interactions between energetic electrons and matter (c) Define how these interactions are used to carry out spectral analysis (d) Compare SEM and TEM methods and know each technique?s limitations 2. Discipline Specific Skills. By the end of this module, the students should: (e) understand how an electron beam is generated and utilized in imaging (f) know what type of information one can extract from the interactions between electrons and the sample in the SEM and TEM (g) comprehend how various detectors work (h) understand the principle of diffraction and its use in structural characterization. (i) know the differences between various techniques to obtain different contrasts in the TEM. 3. Individual and Key Skills. By the end of this module, the students will: (j) gain an understanding of fundamentals of imaging using electrons (k) be able to reach a level where they can decide which technique they would use in their research. (l) relate various types of contrasts in both SEM and TEM to the processes that might have taken place in materials. (m) be at a level where they will know how to present their results they obtained using electron microscopy in their research. (s) think and make decisions on the path which will enable them to resolve a given issue. |
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Course Objective
To teach the students the theory and the practice of imaging and diffraction using electrons. Students get formal lectures in imaging in SEM and TEM and diffraction in TEM. They also learn spectral analysis in SEM and TEM. They have to apply what they learn in class to practical use in lab sessions.
Sustainable Development Goals (SDGs) Related to This Course:
| Industry, Innovation and Infrastructure |
Course Materials
Resources:
1. Scanning Electron Microscopy and X-Ray Microanalysis
Yazarları
Joseph Goldstein, Dale E. Newbury, David C. Joy, Linda Sawyer, Eric Lyman, J.R. Michael, Patrick Echlin, Eric Lifshin
2. Transmission Electron Microscopy: A Textbook for Materials Science
Yazarlar:
David B. Williams , C. Barry Carter
Yazarları
Joseph Goldstein, Dale E. Newbury, David C. Joy, Linda Sawyer, Eric Lyman, J.R. Michael, Patrick Echlin, Eric Lifshin
2. Transmission Electron Microscopy: A Textbook for Materials Science
Yazarlar:
David B. Williams , C. Barry Carter
Technology Requirements:
A laptop access will be helpful